"Tester-Assisted Calibration and Screening for Digitally-Calibrated ADCs."

Hsiu-Ming Chang, Kuan-Yu Lin, Kwang-Ting (Tim) Cheng (2011)

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DOI: 10.1109/TCSI.2011.2158706

access: closed

type: Journal Article

metadata version: 2022-12-07

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Hsiu-Ming Chang, Kuan-Yu Lin, Kwang-Ting (Tim) Cheng:
Tester-Assisted Calibration and Screening for Digitally-Calibrated ADCs. IEEE Trans. Circuits Syst. I Regul. Pap. 58-I(12): 2838-2848 (2011)

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