"All-Digital Circuit-Level Dynamic Variation Monitor for Silicon Debug and ..."

Keith A. Bowman et al. (2011)

> Home

Details and statistics

DOI: 10.1109/TCSI.2011.2163893

access: closed

type: Journal Article

metadata version: 2024-10-06

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tcas/BowmanTTRKGLAKD11
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tcas/BowmanTTRKGLAKD11
Keith A. Bowman, Carlos Tokunaga, James W. Tschanz, Arijit Raychowdhury, Muhammad M. Khellah, Bibiche M. Geuskens, Shih-Lien Lu, Paolo A. Aseron, Tanay Karnik, Vivek K. De:
All-Digital Circuit-Level Dynamic Variation Monitor for Silicon Debug and Adaptive Clock Control. IEEE Trans. Circuits Syst. I Regul. Pap. 58-I(9): 2017-2025 (2011)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.