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"Boosting Latent Defect Coverage in Automotive Mixed-Signal ICs Using SVM ..."
Nektar Xama et al. (2023)
- Nektar Xama
, Jhon Gomez
, Wim Dobbelaere, Ronny Vanhooren, Anthony Coyette
, Georges G. E. Gielen
:
Boosting Latent Defect Coverage in Automotive Mixed-Signal ICs Using SVM Classifiers. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 42(10): 3426-3435 (2023)

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