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"Test generation and concurrent error detection in current-mode A/D converters."

Chin-Long Wey, Shoba Krishnan, Sondes Sahli (1995)

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DOI: 10.1109/43.466344

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - journals/tcad/WeyKS95
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  - https://dblp.org/rec/journals/tcad/WeyKS95
Chin-Long Wey, Shoba Krishnan, Sondes Sahli:
Test generation and concurrent error detection in current-mode A/D converters. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 14(10): 1291-1298 (1995)

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