"Split-Masking: An Output Masking Scheme for Effective Compound Defect ..."

Chao-Wen Tzeng, Shi-Yu Huang (2010)

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DOI: 10.1109/TCAD.2010.2043758

access: closed

type: Journal Article

metadata version: 2020-09-24

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Chao-Wen Tzeng, Shi-Yu Huang:
Split-Masking: An Output Masking Scheme for Effective Compound Defect Diagnosis in Scan Architecture With Test Compression. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 29(5): 834-839 (2010)

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