"Statistics associated with spatial fault simulation used for evaluating ..."

Charles H. Stapper (1991)

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DOI: 10.1109/43.67793

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type: Journal Article

metadata version: 2020-09-24

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Charles H. Stapper:
Statistics associated with spatial fault simulation used for evaluating integrated circuit yield enhancement. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 10(3): 399-406 (1991)

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