


default search action
"Detectability of CMOS stuck-open faults using random and pseudorandom test ..."
Sarma Sastry, Melvin A. Breuer (1988)
- Sarma Sastry, Melvin A. Breuer:
Detectability of CMOS stuck-open faults using random and pseudorandom test sequences. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 7(9): 933-946 (1988)

manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.