"TAO-BIST: A framework for testability analysis and optimization ..."

Srivaths Ravi, Ganesh Lakshminarayana, Niraj K. Jha (2000)

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DOI: 10.1109/43.856976

access: closed

type: Journal Article

metadata version: 2020-09-24

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Srivaths Ravi, Ganesh Lakshminarayana, Niraj K. Jha:
TAO-BIST: A framework for testability analysis and optimization forbuilt-in self-test of RTL circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 19(8): 894-906 (2000)

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