"Analytical yield prediction considering leakage/performance correlation."

Rajeev R. Rao et al. (2006)

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DOI: 10.1109/TCAD.2005.858351

access: closed

type: Journal Article

metadata version: 2020-09-24

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Rajeev R. Rao, Anirudh Devgan, David T. Blaauw, Dennis Sylvester:
Analytical yield prediction considering leakage/performance correlation. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 25(9): 1685-1695 (2006)

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