"Testability-Driven Random Test-Pattern Generation."

Robert Lisanke et al. (1987)

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DOI: 10.1109/TCAD.1987.1270348

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type: Journal Article

metadata version: 2020-09-24

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Robert Lisanke, Franc Brglez, Aart J. de Geus, David Gregory:
Testability-Driven Random Test-Pattern Generation. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 6(6): 1082-1087 (1987)

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