"Testing Transition Delay Faults in Modified Booth Multipliers."

Hsing-Chung Liang, Pao-Hsin Huang, Yan-Fei Tang (2008)

> Home

Details and statistics

DOI: 10.1109/TCAD.2008.927761

access: closed

type: Journal Article

metadata version: 2022-05-26

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tcad/LiangHT08
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tcad/LiangHT08
Hsing-Chung Liang, Pao-Hsin Huang, Yan-Fei Tang:
Testing Transition Delay Faults in Modified Booth Multipliers. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 27(9): 1693-1697 (2008)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.