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"Multilevel Full-Chip Routing With Testability and Yield Enhancement."

Katherine Shu-Min Li et al. (2007)

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DOI: 10.1109/TCAD.2007.895587

access: closed

type: Journal Article

metadata version: 2023-03-07

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  - https://dblp.org/rec/journals/tcad/LiCLSC07
Katherine Shu-Min Li, Yao-Wen Chang, Chung-Len Lee, Chauchin Su, Jwu E. Chen:
Multilevel Full-Chip Routing With Testability and Yield Enhancement. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 26(9): 1625-1636 (2007)

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