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"$2^{n}$ Pattern Run-Length for Test Data Compression."

Lung-Jen Lee et al. (2012)

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DOI: 10.1109/TCAD.2011.2176733

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - https://dblp.org/rec/journals/tcad/LeeTLC12
Lung-Jen Lee, Wang-Dauh Tseng, Rung-Bin Lin, Cheng-Ho Chang:
$2^{n}$ Pattern Run-Length for Test Data Compression. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31(4): 644-648 (2012)

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