"Novel Error-Tolerant Voltage-Divider-Based Through-Silicon-Via Test ..."

Youngkwang Lee et al. (2023)

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DOI: 10.1109/TCAD.2022.3172058

access: closed

type: Journal Article

metadata version: 2024-02-27

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Youngkwang Lee, Donghyun Han, Sooryeong Lee, Sungho Kang:
Novel Error-Tolerant Voltage-Divider-Based Through-Silicon-Via Test Architecture. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 42(1): 308-321 (2023)

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