"Partial-scan delay fault testing of asynchronous circuits."

Michael Kishinevsky et al. (1998)

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DOI: 10.1109/43.736191

access: closed

type: Journal Article

metadata version: 2020-09-24

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Michael Kishinevsky, Alex Kondratyev, Luciano Lavagno, Alexander Saldanha, Alexander Taubin:
Partial-scan delay fault testing of asynchronous circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 17(11): 1184-1199 (1998)

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