"An Analytical Model for Hot Carrier Induced Long-Term Degradation in Power ..."

Hossein Eslahi et al. (2020)

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DOI: 10.1109/TCAD.2019.2952554

access: closed

type: Journal Article

metadata version: 2020-10-06

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Hossein Eslahi, Sayed Ali Albahrani, Dhawal Mahajan, Sourabh Khandelwal:
An Analytical Model for Hot Carrier Induced Long-Term Degradation in Power Amplifiers. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39(10): 2000-2005 (2020)

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