"A Novel Scheme for Tolerating Single Event/Multiple Bit Upsets (SEU/MBU) ..."

Wei Wei et al. (2016)

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DOI: 10.1109/TC.2015.2462811

access: closed

type: Journal Article

metadata version: 2020-07-22

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Wei Wei, Kazuteru Namba, Yong-Bin Kim, Fabrizio Lombardi:
A Novel Scheme for Tolerating Single Event/Multiple Bit Upsets (SEU/MBU) in Non-Volatile Memories. IEEE Trans. Computers 65(3): 781-790 (2016)

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