"Reaping Both Latency and Reliability Benefits With Elaborate Sanitization ..."

Wei-Chen Wang et al. (2023)

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DOI: 10.1109/TC.2023.3272280

access: closed

type: Journal Article

metadata version: 2023-10-27

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Wei-Chen Wang, Chien-Chung Ho, Yung-Chun Li, Liang-Chi Chen, Yu-Ming Chang:
Reaping Both Latency and Reliability Benefits With Elaborate Sanitization Design for 3D TLC NAND Flash. IEEE Trans. Computers 72(11): 3029-3041 (2023)

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