"Test Algorithms for ECC-Based Memory Repair in Ultimate CMOS and Post-CMOS."

Panagiota Papavramidou, Michael Nicolaidis (2016)

> Home

Details and statistics

DOI: 10.1109/TC.2015.2479618

access: closed

type: Journal Article

metadata version: 2017-05-20

- view
  authority control:
- export record
  dblp key:
  - journals/tc/PapavramidouN16
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tc/PapavramidouN16
Panagiota Papavramidou, Michael Nicolaidis:
Test Algorithms for ECC-Based Memory Repair in Ultimate CMOS and Post-CMOS. IEEE Trans. Computers 65(7): 2284-2298 (2016)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.