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2020 – today
- 2023
[j3]Panagiota Papavramidou, Michael Nicolaidis
:
Reducing Power Dissipation in Memory Repair for High Fault Rates. IEEE Trans. Very Large Scale Integr. Syst. 31(12): 2112-2125 (2023)- 2020
- [j2]Panagiota Papavramidou, Michael Nicolaidis:
Iterative Diagnosis Approach for ECC-Based Memory Repair. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39(2): 464-477 (2020) - [c8]Panagiota Papavramidou, Michael Nicolaidis, Patrick Girard:
An ECC-Based Repair Approach with an Offset-Repair CAM for Mitigating the MBUs Affecting Repair CAM. IOLTS 2020: 1-6
2010 – 2019
- 2019
- [e2]Dimitris Gizopoulos, Dan Alexandrescu, Panagiota Papavramidou, Michail Maniatakos:
25th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2019, Rhodes, Greece, July 1-3, 2019. IEEE 2019, ISBN 978-1-7281-2490-2 [contents] - 2018
- [e1]Dimitris Gizopoulos, Dan Alexandrescu, Mihalis Maniatakos, Panagiota Papavramidou:
24th IEEE International Symposium on On-Line Testing And Robust System Design, IOLTS 2018, Platja D'Aro, Spain, July 2-4, 2018. IEEE 2018, ISBN 978-1-5386-5992-2 [contents] - 2016
- [j1]Panagiota Papavramidou, Michael Nicolaidis:
Test Algorithms for ECC-Based Memory Repair in Ultimate CMOS and Post-CMOS. IEEE Trans. Computers 65(7): 2284-2298 (2016) - [c7]Panagiota Papavramidou:
Memory repair for high fault rates. ITC 2016: 1-10 - 2015
- [c6]Panagiota Papavramidou, Michael Nicolaidis:
Low-power memory repair for high defect densities. IOLTS 2015: 171-173 - [c5]Michael Nicolaidis, Panagiota Papavramidou:
Memory repair for high defect densities. VTS 2015: 1-4 - 2013
- [c4]Panagiota Papavramidou, Michael Nicolaidis:
Reducing power dissipation in memory repair for high defect densities. ETS 2013: 1-7 - [c3]Michael Nicolaidis, Panagiota Papavramidou:
Transparent BIST for ECC-based memory repair. IOLTS 2013: 216-223 - [c2]Panagiota Papavramidou, Michael Nicolaidis:
An iterative diagnosis approach for ECC-based memory repair. VTS 2013: 1-6 - 2012
- [c1]Panagiota Papavramidou, Michael Nicolaidis:
Test algorithms for ECC-based memory repair in nanotechnologies. VTS 2012: 228-233
Coauthor Index
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