"Test Sets for Robust Path Delay Fault Testing on Two-Rail Logic Circuits."

Kazuteru Namba, Hideo Ito (2011)

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DOI: 10.1109/TC.2010.230

access: closed

type: Journal Article

metadata version: 2017-05-20

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Kazuteru Namba, Hideo Ito:
Test Sets for Robust Path Delay Fault Testing on Two-Rail Logic Circuits. IEEE Trans. Computers 60(10): 1459-1470 (2011)

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