"A Unified Negative-Binomial Distribution for Yield Analysis of ..."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Israel Koren, Zahava Koren, Charles H. Stapper (1993)

> Home

Details and statistics

DOI: 10.1109/12.277291

access: closed

type: Journal Article

metadata version: 2017-05-20

- view
  authority control:
- export record
  dblp key:
  - journals/tc/KorenKS93
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tc/KorenKS93
Israel Koren, Zahava Koren, Charles H. Stapper:
A Unified Negative-Binomial Distribution for Yield Analysis of Defect-Tolerant Circuits. IEEE Trans. Computers 42(6): 724-734 (1993)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.