"A Random and an Algorithmic Technique for Fault Detection Test Generation ..."

Melvin A. Breuer (1971)

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DOI: 10.1109/T-C.1971.223140

access: closed

type: Journal Article

metadata version: 2017-05-20

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Melvin A. Breuer:
A Random and an Algorithmic Technique for Fault Detection Test Generation for Sequential Circuits. IEEE Trans. Computers 20(11): 1364-1370 (1971)

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