"Cascading Failure Modeling for Circuit Systems Considering Continuous ..."

Yi Jin, Qingyuan Zhang (2024)

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DOI: 10.3390/SYM16040488

access: open

type: Journal Article

metadata version: 2024-07-19

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Yi Jin, Qingyuan Zhang:
Cascading Failure Modeling for Circuit Systems Considering Continuous Degradation and Random Shocks Using an Impedance Network. Symmetry 16(4): 488 (2024)

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