"A Multi-Modal Edge Consistency Metric Based on Regression Robustness of ..."

Mingzhu Zhu et al. (2021)

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DOI: 10.1109/LSP.2021.3080196

access: closed

type: Journal Article

metadata version: 2021-07-13

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Mingzhu Zhu, Junzhi Yu, Zhang Gao, Bingwei He, Jiantao Liu:
A Multi-Modal Edge Consistency Metric Based on Regression Robustness of Truncated SVD. IEEE Signal Process. Lett. 28: 1065-1069 (2021)

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