"Gamma processes and peaks-over-threshold distributions for time-dependent ..."

Jan M. van Noortwijk et al. (2007)

> Home

Details and statistics

DOI: 10.1016/J.RESS.2006.11.003

access: closed

type: Journal Article

metadata version: 2020-02-25

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/ress/NoortwijkWKP07
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/ress/NoortwijkWKP07
Jan M. van Noortwijk, Johannes A. M. van der Weide, Maarten-Jan Kallen, Mahesh D. Pandey:
Gamma processes and peaks-over-threshold distributions for time-dependent reliability. Reliab. Eng. Syst. Saf. 92(12): 1651-1658 (2007)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.