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Mahesh D. Pandey
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2020 – today
- 2022
- [j15]Xufang Zhang, Mahesh D. Pandey, Ruyu Yu, Zhenguang Wu:
HALK: A hybrid active-learning Kriging approach and its applications for structural reliability analysis. Eng. Comput. 38(4): 3039-3055 (2022) - [j14]Elizabeth Bismut, Mahesh D. Pandey, Daniel Straub:
Reliability-based inspection and maintenance planning of a nuclear feeder piping system. Reliab. Eng. Syst. Saf. 224: 108521 (2022) - 2021
- [j13]Bin Liu, Mahesh D. Pandey, Xiaolin Wang, Xiujie Zhao:
A finite-horizon condition-based maintenance policy for a two-unit system with dependent degradation processes. Eur. J. Oper. Res. 295(2): 705-717 (2021) - [j12]Xian-Xun Yuan, Eishiro Higo, Mahesh D. Pandey:
Estimation of the value of an inspection and maintenance program: A Bayesian gamma process model. Reliab. Eng. Syst. Saf. 216: 107912 (2021) - 2020
- [j11]Indranil Hazra, Mahesh D. Pandey, Noldainerick Manzana:
Approximate Bayesian computation (ABC) method for estimating parameters of the gamma process using noisy data. Reliab. Eng. Syst. Saf. 198: 106780 (2020)
2010 – 2019
- 2019
- [j10]Xufang Zhang, Jiankai Liu, Ying Yan, Mahesh D. Pandey:
An Effective Approach for Reliability-Based Sensitivity Analysis with the Principle of Maximum Entropy and Fractional Moments. Entropy 21(7): 649 (2019) - 2016
- [j9]Gordon J. Savage, Xufang Zhang, Young Kap Son, Mahesh D. Pandey:
Reliability of mechanisms with periodic random modal frequencies using an extreme value-based approach. Reliab. Eng. Syst. Saf. 150: 65-77 (2016) - 2015
- [j8]Johannes A. M. van der Weide, Mahesh D. Pandey:
A stochastic alternating renewal process model for unavailability analysis of standby safety equipment. Reliab. Eng. Syst. Saf. 139: 97-104 (2015) - 2014
- [j7]Xufang Zhang, Mahesh D. Pandey:
An effective approximation for variance-based global sensitivity analysis. Reliab. Eng. Syst. Saf. 121: 164-174 (2014) - 2012
- [j6]Tianjin Cheng, Mahesh D. Pandey, Johannes A. M. van der Weide:
The probability distribution of maintenance cost of a system affected by the gamma process of degradation: Finite time solution. Reliab. Eng. Syst. Saf. 108: 65-76 (2012) - 2011
- [j5]Johannes A. M. van der Weide, Mahesh D. Pandey:
Stochastic analysis of shock process and modeling of condition-based maintenance. Reliab. Eng. Syst. Saf. 96(6): 619-626 (2011) - 2010
- [j4]Johannes A. M. van der Weide, Mahesh D. Pandey, Jan M. van Noortwijk:
Discounted cost model for condition-based maintenance optimization. Reliab. Eng. Syst. Saf. 95(3): 236-246 (2010)
2000 – 2009
- 2009
- [j3]Xian-Xun Yuan, Mahesh D. Pandey:
A nonlinear mixed-effects model for degradation data obtained from in-service inspections. Reliab. Eng. Syst. Saf. 94(2): 509-519 (2009) - [j2]Xian-Xun Yuan, D. Mao, Mahesh D. Pandey:
A Bayesian approach to modeling and predicting pitting flaws in steam generator tubes. Reliab. Eng. Syst. Saf. 94(11): 1838-1847 (2009) - 2007
- [j1]Jan M. van Noortwijk, Johannes A. M. van der Weide, Maarten-Jan Kallen, Mahesh D. Pandey:
Gamma processes and peaks-over-threshold distributions for time-dependent reliability. Reliab. Eng. Syst. Saf. 92(12): 1651-1658 (2007)
Coauthor Index
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