"Application of optimal clustering and metric learning to patch-based ..."

Jae-Young Ahn, Gyeonghwan Kim (2022)

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DOI: 10.1016/J.PATREC.2022.01.017

access: closed

type: Journal Article

metadata version: 2022-03-19

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Jae-Young Ahn, Gyeonghwan Kim:
Application of optimal clustering and metric learning to patch-based anomaly detection. Pattern Recognit. Lett. 154: 110-115 (2022)

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