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Pattern Recognition Letters, Volume 154
Volume 154, February 2022
- Han Yu, Congju Du, Li Yu:
Scale-aware heatmap representation for human pose estimation. 1-6 - Pradipta Sasmal, Manas Kamal Bhuyan, Soumayan Dutta, Yuji Iwahori:
An unsupervised approach of colonic polyp segmentation using adaptive markov random fields. 7-15 - Shaohua Wang, Xiao Kang, Fasheng Liu, Xiushan Nie, Xingbo Liu:
Supervised discrete hashing for hamming space retrieval. 16-21 - Zhi Jin, Junjia Huang, Aolin Xiong, Yuxian Pang, Wenjin Wang, Beichen Ding:
Attention guided deep features for accurate body mass index estimation. 22-28 - Gonzalo Nápoles, Lisa Koutsoviti Koumeri:
A fuzzy-rough uncertainty measure to discover bias encoded explicitly or implicitly in features of structured pattern classification datasets. 29-36 - Siladittya Manna, Saumik Bhattacharya, Umapada Pal:
Self-supervised representation learning for detection of ACL tear injury in knee MR videos. 37-43 - Hyewon Choi, Youngjoong Ko:
Effective fake news video detection using domain knowledge and multimodal data fusion on youtube. 44-52 - Xiaolian Wang, Xiyuan Hu, Chen Chen, Silong Peng:
Regularizing deep networks with label geometry for accurate object localization on small training datasets. 53-59 - Chao Chen, Jinhong Mao, Xinzhi Liu, Yi Tan, Ghada M. Abaido, Hamdy Alsayed:
Compressed feature vector-based effective object recognition model in detection of COVID-19. 60-67 - Shu-Fang Xia, Song-tao Guo, Zhong Qu, Yuanyuan Yang:
Robust patchmatch HDR image reconstruction for deghosting. 68-74 - Lorraine Chambers, Mohamed Medhat Gaber:
DeepStreamOS: Fast open-Set classification for convolutional neural networks. 75-82 - Rakhoon Hwang, Hanjin Lee, Hyung Ju Hwang:
Option compatible reward inverse reinforcement learning. 83-89 - Yeganeh M. Marghi, Aziz Koçanaogullari, Murat Akçakaya, Deniz Erdogmus:
Active recursive Bayesian inference using Rényi information measures. 90-98 - Huajun Liu, Zuyuan Yang, Haofeng Zhang, Cailing Wang:
Edge detection with attention: From global view to local focus. 99-109 - Jae-Young Ahn, Gyeonghwan Kim:
Application of optimal clustering and metric learning to patch-based anomaly detection. 110-115
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