"Comparative study of reliability degradation behaviors of LDMOS and ..."

Zhihui Yu et al. (2016)

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DOI: 10.1016/J.MICROREL.2015.12.024

access: closed

type: Journal Article

metadata version: 2020-02-22

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Zhihui Yu, Hao Jin, Shurong Dong, Hei Wong, Jie Zeng, Weihuai Wang:
Comparative study of reliability degradation behaviors of LDMOS and LDMOS-SCR ESD protection devices. Microelectron. Reliab. 61: 111-114 (2016)

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