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"Support excitation scheme for transient analysis of JEDEC board-level drop ..."
Chang-Lin Yeh, Yi-Shao Lai (2006)
- Chang-Lin Yeh, Yi-Shao Lai:
Support excitation scheme for transient analysis of JEDEC board-level drop test. Microelectron. Reliab. 46(2-4): 626-636 (2006)
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