"Improved device variability in scaled MOSFETs with deeply retrograde ..."

Jason Woo et al. (2014)

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DOI: 10.1016/J.MICROREL.2013.11.003

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type: Journal Article

metadata version: 2023-10-01

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Jason Woo, Po-Yen Chien, Frank Yang, Seung Chul Song, P. R. Chidi Chidambaram, Joseph Wang, Geoffrey Yeap:
Improved device variability in scaled MOSFETs with deeply retrograde channel profile. Microelectron. Reliab. 54(6-7): 1090-1095 (2014)

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