"Low-frequency noise study in electron devices: review and update."

Hei Wong (2003)

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DOI: 10.1016/S0026-2714(02)00347-5

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type: Journal Article

metadata version: 2020-02-22

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Hei Wong:
Low-frequency noise study in electron devices: review and update. Microelectron. Reliab. 43(4): 585-599 (2003)

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