"Gate dielectric breakdown in the time-scale of ESD events."

Bonnie E. Weir et al. (2005)

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DOI: 10.1016/J.MICROREL.2004.12.004

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type: Journal Article

metadata version: 2025-03-03

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Bonnie E. Weir, Che-Choi Leung, Paul J. Silverman, Muhammad Ashraful Alam:
Gate dielectric breakdown in the time-scale of ESD events. Microelectron. Reliab. 45(3-4): 427-436 (2005)

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