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"Determination of migration effects in Cu-via structures with respect to ..."
Kirsten Weide-Zaage et al. (2008)
- Kirsten Weide-Zaage, Jiani Zhao, Joharsyah Ciptokusumo, Oliver Aubel:
Determination of migration effects in Cu-via structures with respect to process-induced stress. Microelectron. Reliab. 48(8-9): 1393-1397 (2008)
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