"Robustness test and failure analysis of IGBT modules during turn-off."

Jesús Urresti-Ibañez et al. (2007)

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DOI: 10.1016/J.MICROREL.2007.07.097

access: closed

type: Journal Article

metadata version: 2021-03-31

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Jesús Urresti-Ibañez, Alberto Castellazzi, M. Piton, José Rebollo, Michel Mermet-Guyennet, Mauro Ciappa:
Robustness test and failure analysis of IGBT modules during turn-off. Microelectron. Reliab. 47(9-11): 1725-1729 (2007)

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