"High-throughput and full automatic DBC-module screening tester for high ..."

Masanori Tsukuda et al. (2015)

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DOI: 10.1016/J.MICROREL.2015.06.016

access: closed

type: Journal Article

metadata version: 2020-02-22

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Masanori Tsukuda, H. Tomonaga, S. Okoda, R. Noda, K. Tashiro, Ichiro Omura:
High-throughput and full automatic DBC-module screening tester for high power IGBT. Microelectron. Reliab. 55(9-10): 1363-1368 (2015)

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