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"Defect detection and modelling using pulsed electrical stress for ..."
Cezary Sydlo et al. (2001)
- Cezary Sydlo, Bastian Mottet, Husin Ganis, Hans L. Hartnagel, Viktor Krozer
, Sylvain L. Delage, Simone Cassette, Eric Chartier, D. Floriot, Steven Bland:
Defect detection and modelling using pulsed electrical stress for reliability investigations of InGaP HBT. Microelectron. Reliab. 41(9-10): 1567-1571 (2001)
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