"Harnessing the base-pushout effect for ESD protection in bipolar and ..."

Martin Streibl et al. (2003)

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DOI: 10.1016/S0026-2714(03)00126-4

access: closed

type: Journal Article

metadata version: 2021-10-14

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  - https://dblp.org/rec/journals/mr/StreiblESSWSG03
Martin Streibl, Kai Esmark, A. Sieck, Wolfgang Stadler, M. Wendel, J. Szatkowski, Harald Gossner:
Harnessing the base-pushout effect for ESD protection in bipolar and BiCMOS technologies. Microelectron. Reliab. 43(7): 1001-1010 (2003)

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