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"Reliability of ultra-thin oxides in CMOS circuits."
James H. Stathis et al. (2003)
- James H. Stathis, Barry P. Linder, Rosana Rodríguez, Salvatore Lombardo:
Reliability of ultra-thin oxides in CMOS circuits. Microelectron. Reliab. 43(9-11): 1353-1360 (2003)
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