"Reliability Investigation of Gallium Nitride HEMT."

A. Sozza et al. (2004)

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DOI: 10.1016/J.MICROREL.2004.07.018

access: closed

type: Journal Article

metadata version: 2020-02-22

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A. Sozza, Christian Dua, Erwan Morvan, Bertrand Grimbert, V. Hoel, Sylvain L. Delage, N. Chaturvedi, Richard Lossy, Joachim Würfl:
Reliability Investigation of Gallium Nitride HEMT. Microelectron. Reliab. 44(9-11): 1369-1373 (2004)

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