"Temperature effects on BTI and soft errors in modern logic circuits."

Warin Sootkaneung, Suppachai Howimanporn, Sasithorn Chookaew (2018)

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DOI: 10.1016/J.MICROREL.2018.07.032

access: closed

type: Journal Article

metadata version: 2025-01-19

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Warin Sootkaneung, Suppachai Howimanporn, Sasithorn Chookaew:
Temperature effects on BTI and soft errors in modern logic circuits. Microelectron. Reliab. 87: 259-270 (2018)

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