"Degradation of pMOSFETs due to hot electron induced punchthrough."

Donghee Son et al. (2016)

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DOI: 10.1016/J.MICROREL.2016.01.003

access: closed

type: Journal Article

metadata version: 2020-02-22

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Donghee Son, Gang-Jun Kim, Ji-Hoon Seo, Nam-Hyun Lee, YongHa Kang, Bongkoo Kang:
Degradation of pMOSFETs due to hot electron induced punchthrough. Microelectron. Reliab. 59: 13-17 (2016)

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