"Comparison of analytic distribution function models for hot-carrier ..."

Prateek Sharma et al. (2015)

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DOI: 10.1016/J.MICROREL.2015.06.021

access: closed

type: Journal Article

metadata version: 2021-10-14

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Prateek Sharma, Stanislav Tyaginov, Yannick Wimmer, Florian Rudolf, Karl Rupp, Hubert Enichlmair, J. H. Park, Hajdin Ceric, Tibor Grasser:
Comparison of analytic distribution function models for hot-carrier degradation modeling in nLDMOSFETs. Microelectron. Reliab. 55(9-10): 1427-1432 (2015)

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