"Statistical modeling of reliability in logic devices."

Jochen Schleifer, Thomas Coenen, Tobias G. Noll (2011)

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DOI: 10.1016/J.MICROREL.2011.07.004

access: closed

type: Journal Article

metadata version: 2020-02-22

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Jochen Schleifer, Thomas Coenen, Tobias G. Noll:
Statistical modeling of reliability in logic devices. Microelectron. Reliab. 51(9-11): 1469-1473 (2011)

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