"Potential failure mode identification of operational amplifier circuit ..."

Junji Sakamoto, Ryoma Hirata, Tadahiro Shibutani (2018)

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DOI: 10.1016/J.MICROREL.2018.04.005

access: closed

type: Journal Article

metadata version: 2020-02-22

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Junji Sakamoto, Ryoma Hirata, Tadahiro Shibutani:
Potential failure mode identification of operational amplifier circuit board by using high accelerated limit test. Microelectron. Reliab. 85: 19-24 (2018)

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