"NBTI product level reliability for a low-power SRAM technology."

Helmut Puchner (2007)

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DOI: 10.1016/J.MICROREL.2006.10.015

access: closed

type: Journal Article

metadata version: 2020-02-22

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Helmut Puchner:
NBTI product level reliability for a low-power SRAM technology. Microelectron. Reliab. 47(6): 873-879 (2007)

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