"Dynamic stress method for accurate NVM oxide robustness evaluation for ..."

D. Pic et al. (2008)

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DOI: 10.1016/J.MICROREL.2008.07.050

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type: Journal Article

metadata version: 2020-02-22

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D. Pic, Arnaud Régnier, V. Pean, Jean-Luc Ogier, Didier Goguenheim:
Dynamic stress method for accurate NVM oxide robustness evaluation for automotive applications. Microelectron. Reliab. 48(8-9): 1318-1321 (2008)

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