"Revisiting MOSFET threshold voltage extraction methods."

Adelmo Ortiz-Conde et al. (2013)

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DOI: 10.1016/J.MICROREL.2012.09.015

access: closed

type: Journal Article

metadata version: 2020-02-22

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Adelmo Ortiz-Conde, Francisco J. García-Sánchez, Juan Muci, Alberto Terán Barrios, Juin J. Liou, Ching-Sung Ho:
Revisiting MOSFET threshold voltage extraction methods. Microelectron. Reliab. 53(1): 90-104 (2013)

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