"High temperature reliability of μtrench Phase-Change Memory devices."

Gabriele Navarro et al. (2012)

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DOI: 10.1016/J.MICROREL.2012.06.017

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type: Journal Article

metadata version: 2024-10-06

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Gabriele Navarro, Sarra Souiki, Alain Persico, Veronique Sousa, Jean-François Nodin, Carine Jahan, François Aussenac, Vincent Delaye, Olga Cueto, Luca Perniola, Barbara De Salvo:
High temperature reliability of μtrench Phase-Change Memory devices. Microelectron. Reliab. 52(9-10): 1928-1931 (2012)

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